BTS2048-IR spectroradiometer with thermoelectrically cooled detector
BTS2048-IR spectroradiometer with thermoelectrically cooled detector
The BTS2048-IR incorporates thermoelectric cooling of its InGaAs array detector and also a cooled InGaAs Diode for the BTS technology. The device meets all the requirements of a high-end diode array spectroradiometer and is favourably priced despite its cutting-edge design. Thermoelectric cooling of the array detector minimizes the dark noise signal.
Description
BTS2048-IR spectroradiometer with thermoelectrically cooled detector
The BTS2048-IR incorporates thermoelectric cooling of its InGaAs array detector and also a cooled InGaAs Diode for the BTS technology. The device meets all the requirements of a high-end diode array spectroradiometer and is favourably priced despite its cutting-edge design. Thermoelectric cooling of the array detector minimizes the dark noise signal.
Innovative detector technology
In order to make use of the advantages of an InGaAs chip that is less noisy compared to an extended InGaAs chip in the possible spectral ranges, a detector chip with both technologies is used. This matches the spectral ranges optimally and thus allows the best electro-optical properties. Other features such as an electronic shutter, OD filter and the proven BTS technology find their place as usual.
Features on a glance
- Spectral range from 950 nm to 2150 nm
- BTS technology (integrated additional diode)
- Electronic shutter and filter wheel with four positions (open, dark, OD1 and OD2)
- Convincing optical properties
- Compact dimensions
- Fast data transmission due to Ethernet and USB interface
- I/O connector
- Traceable calibration
User software and developer software
The standard S-BTS2048user software has a customizable user interface and a large number of display and function modules that can be activated when configuring the BTS2048-IR with the respective accessory components from Gigahertz-Optik GmbH. The S-SDK-BTS2048developer software is offered for the integration of the BTS2048-IR in custom software.
Calibration
One essential quality feature of photometric devices is their precise and traceable calibration. The BTS2048-IR is calibrated by Gigahertz-Optik’s calibration laboratory that was accredited by DAkkS (D-K-15047-01-00) for the spectral responsivity and spectral irradiance according to ISO/IEC 17025. The calibration also included the corresponding accessory components. Every device is delivered with its respective calibration certificate.
Specifications
TE cooled spectroradiometer with a wide dynamic range for CW and short-term measurement of the irradiance, spectrum, and peak wavelength. Accessories for other parameters.
Compact device. BiTec detector with TE cooled detector (512 pixels, 9 nm optical resolution, electronic shutter), and additional InGaAs diode. Optical bandwidth correction (CIE214). Filter wheel with shutter and OD-Filter. Input lens with diffusor window. Cosine field of view.
Spectral: 3E-4 W/(m²nm) to 1.6E4 W/(m²nm) @1600 nm. Responsivity from 950 nm to 2150 nm.
Diode array spectroradiometer for R&D applications and for the integration in testing systems.
Factory calibration. Traceable to international calibration standards
Spectral irradiance (W/(m² nm)), irradiance (W/m²), spectral radiant intensity (W/(sr nm)), radiant Intensity (W/sr), peak wavelength, center wavelength, centroid wavelength, etc.. Option integrating sphere: in addition spectral flux (W/nm). Option goniometer: in addition radiant intensity (W/sr)
Diffusor, cosine corrected field of view
4 positions (open, closed, OD1, OD2). Use for remote dark current measurement and dynamic range extension.
Parallel measurement with diode and array is possible, thereby an online correction of the spectral mismatch of the diode through a*(sz(λ)) respectively F*(sz(λ)).
Spectral irradiance
λ | u(k=2) |
(950 – 1039) nm | 4 % |
(1040 – 1549) nm | 4,5 % |
(1550 – 1949) nm (sensor part 1*) | 5 % |
(1550 – 1949) nm (sensor part 2*) | 6 % |
(1950 – 2049) nm | 6,8 % |
(2050 – 2150) nm | 7,5 % |
Spectral irradiance responsivity (950 – 2150) nm
* in this region the transition from sensor part 1 to sensor part 2 takes place. Uncertainty increases.
10 µs – 10 s *11
(950 -2150) nm
9 nm
~2.3 nm/Pixel
512
cooled highly sensitive InGaAs chip with second order filter
16bit
± 1 nm
mathematical online band-pass correction is supported
completely linearized chip >99% *10
7 cts *1
5000 *2
8 Magnitudes
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Nine (9) measurement ranges with offset correction
Optional: (15 to 6E7) W/m²
responsivity range: (1050 – 2100) nm
Optional: Spectral responsivity with radiometric matching. Online correction of the radiometric matching through spectral measurement data (spectral missmatch factor correction).
32bit for device control,16bit for detector array control, 8bit for photodiode control
USB V2.0, Ethernet (LAN UDP protocol), RS232, RS485
Standard for 512 float array values via ethernet 5 ms
2x (0 – 25) VDC, 1x optocoupler isolated 5 V / 5 mA
2x open collector, max. 25 V, max. 500 mA
Trigger input incorporated (different options, rising/falling edge, delayed, etc.)
User software S-BTS2048
Optional software development kit S-SDK-BTS2048 for user software set-ups based on .dll‘s in C, C++,C# or in LabView.
With power supply: DC Input 5V (±10 %) at 3000 mA
Temperature stabilization chip: ≤ ± 0.25 °C
135 mm x 107 mm x 90 mm (Length x Width x Height)
1000g
Tripod and M6 screw threads
Front adapter UMPA-1.0-HL for use with integrating sphere port-frame UMPF-1.0-HL
Storage: (-10 to 50) °C
Operation: (10 to 30) °C *9
* 1 typical value measured without averaging with an integration time of 1ms (standard deviation). With averaging the base line noise reduces.
* 2 typical value measured without averaging with a measuring time of 1ms and full saturation of the detector. With averaging the SNR increases.
*9 The device takes about 25 minutes to stabilize in temperature. If measurements are taken in the warm-up phase or at non-constant temperatures, a new dark measurement is required for each measurement.
*10 The chip is basend on two different materials depending on the spectral range. Upper half (extendend InGaAs) may show a higher uncertainty at longer integration times.
*11 At longer integration times the possible saturation for the extendend InGaAs range may be limited by ambient temperature
Documentation
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